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YIC Technologies NFP SET | EMC probe set including near field probes HXY 10A02, HXY 20A02, HZ 40A02, HXY 60A01, E 00A02

Manufacturer number: NFP SET

YIC Technologies NFP SET
YIC Technologies NFP SET
YIC Technologies NFP SET
YIC Technologies NFP SET
YIC Technologies NFP SET
YIC Technologies NFP SET
YIC Technologies NFP SET
YIC Technologies NFP SET
YIC Technologies NFP SET
YIC Technologies NFP SET
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YIC Technologies NFP SET | EMC probe set including 5 near-field probes HXY 10A02, HXY 20A02, HZ 40A02, HXY 60A01, E 00A02.

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Description

NFP SET | EMC probe set including near field probes HXY 10A02, HXY 20A02, HZ 40A02, HXY 60A01, E 00A02

The NFP SET from YIC Technologies includes 5 near-field probes and is used to locate, identify, measure and characterize potential sources of electromagnetic radiation and interference emanating from conductor tracks or components of electronic circuit boards, assemblies or products.

A compatible spectrum analyzer with 50 Ω input is required.

The near-field probes can be operated by hand or used on the EMProbe robot arm or other holders.

The NFP SET consists of:

  • HXY 10A02: 10MHz - 300MHz
  • HXY 20A02: 100MHz – 1.4GHz
  • HZ 40A02: 1GHz – 14GHz
  • HXY 60A01: 1GHz – 14GHz
  • E 00A02: Full range

Product features:

  • Fully integrated into EMViewer
  • Real-time tracking of probe position
  • Flat response
  • Slim design and protective coating

Alternate products (3 products )

YIC Technologies NFP KIT
YIC Technologies NFP KIT
EMC probe set including 5 near-field probes, camera, holder, EMViewer 1 year license
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YIC Technologies NFP KIT
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EMC probe set including 5 near-field probes, camera, holder, EMViewer 5 year license
Delivery time upon request
On Request
YIC Technologies NFP KIT
YIC Technologies NFP KIT
EMC probe set including 5 near-field probes, camera, holder, EMViewer 3 year license
Delivery time upon request
On Request

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About the Manufacturer

YIC Technologies
YIC Technologies
YIC Technologies, based in the UK, specializes in near-field EMC scanner boards for real-time visualization of signal emissions, which can be used to visualize EMC and EMI-related signals in real time to detect signal emissions.
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