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Manufacturer number: NFP KIT
On Request
The YIC Technologies NFP KIT consists of a set of 5 field probes and is used to locate, identify, measure and characterize potential sources of electromagnetic radiation and interference emanating from traces or components of electronic circuit boards, assemblies or products.
A compatible spectrum analyzer with 50 Ω input is required.
In conjunction with the EMViewer software and the camera included in the set, the HF radiation from the circuit board or the device can be visualized. The probe is guided over the circuit, the camera records the position of the probe and the field strength is displayed in color code as an overlay over the image in the EMViewer software.
The near-field probes can be operated by hand or used on the EMProbe robot arm or other holders.