Wayne Kerr 3260B | Precision Magnetics Analyzer, 20 Hz - 3 MHz, basic accuracy: 0.1%

Manufacturer number: 3260B

Wayne Kerr 3260B | Precision magnetic field analyzer (H field), 20 Hz - 3 MHz, basic accuracy: 0.1%.

  • Frequency range: 20 Hz ... 3 MHz
  • Basic accuracy 0.1%
  • Measuring functions: C, L, R, X, G, B, D, Q, Z, Y, Ø - parallel or serial
  • Internal DC bias: 1mA - 1A
  • Display: LCD 320 x 240
  • Measuring interfaces: 8 BNC sockets on the front, 2- or 4-wire measurement (Kelvin) with shield at ground potential. Equivalent circuit symbols on the screen. Separate terminals for primary and secondary connections. LEDs indicate active terminals
  • Interfaces: GPIB, BINNING

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Description

3260B | Precision Magnetics Analyzer, 20 Hz - 3 MHz, basic accuracy: 0.1%

In the design phase of component development, it is extremely important to understand how the component behaves under different operating conditions. This may include operating at different frequencies, AC drive levels, or DC bias currents.

The Wayne Kerr 3260B Precision Magnetics Analyzer can record all measurement functions such as inductance (L) or impedance (Z) (including secondary term) against frequency, frequency converter level or DC bias current.

Frequency sweeps in the range from 20 Hz to 3 MHz can be selected. You can choose between linear or logarithmic frequency displays.

The Wayne Kerr 3260B is particularly suitable for measuring parameters on telecommunication transformers.

The selected parameter and its secondary value are shown graphically. The AC drive levels can be set between 1 mV and 10 V. The DC bias current can be set internally from 1 mA to 1 A. When using external DC bias modules with 3265B and 25 A, the bias currents can be set to a maximum of 125 A.

Product features

  • Characterizes components from 20Hz to 3MHz
  • Up to 125 ADC with WK3265
  • DC bias
  • Gear ratio, winding sense
  • Winding capacity
  • Resonance frequency search
  • Telekom measurement function
  • Graph function

Accessoires (6 products)

3260-N
Wayne Kerr
3260-N
Insulation resistance option, for product series 3260
Delivery time upon request
On Request
3260-S
Wayne Kerr
3260-S
Faster DC Bias Current ramp up and down option, for product series 3260
Delivery time upon request
On Request
3260-G
Wayne Kerr
3260-G
Analysis / Graph Function option, for product series 3260
Delivery time upon request
On Request
3260-T
Wayne Kerr
3260-T
LF Telecom Function option, for product series 3260
Delivery time upon request
On Request
3260-B2
Wayne Kerr
3260-B2
BIN Handler option, isolated, for product series 3260
Delivery time upon request
On Request
3260-D
Wayne Kerr
3260-D
BIN Handler option, non-isolated, for product series 3260
Delivery time upon request
On Request

Recommendations (17 products)

1EV1006
Wayne Kerr
1EV1006
Test holder for components, 4 terminals, 20 Hz - 3 MHz, length: 1 m
Delivery time upon request
On Request
1EV1505
Wayne Kerr
1EV1505
Alligator clip cable for LCR meter, 4 terminals, length: 60 cm
Delivery time upon request
On Request
1EV1905A
Wayne Kerr
1EV1905A
SMD Probe Lead, 2 terminal
Delivery time upon request
On Request
1EV1905X
Wayne Kerr
1EV1905X
SMD Probe Lead with 1J1023 adapter 4 to 2 terminal
Delivery time upon request
On Request
1EVA40100
Wayne Kerr
1EVA40100
Kelvin measuring cable with small terminals, 4 terminals, 20 Hz - 3 MHz, length: 60 cm
Delivery time upon request
On Request
1EVA40120
Wayne Kerr
1EVA40120
Tweezers test adapter for SMD, 4 terminals, 20 Hz - 3 MHz, length: 1.5 m
Delivery time upon request
On Request
1EVA40150
Wayne Kerr
1EVA40150
Kelvin measuring cable with small terminals, Economy 4 terminal, 20 Hz - 3 MHz, length: 60 cm
Delivery time upon request
On Request
1EVA40180
Wayne Kerr
1EVA40180
Kelvin measuring cable with large terminals, 4 terminals, 20 Hz - 3 MHz, length: 60 cm
Delivery time upon request
On Request
1J1015
Wayne Kerr
1J1015
Test holder for components, 125 A, 2 terminals, for series 3265
Delivery time upon request
On Request
1J1016
Wayne Kerr
1J1016
Test holder for SMD, 125 A, 2 terminal, for series 3265
Delivery time upon request
On Request
1J1020
Wayne Kerr
1J1020
Test adapter for dielectric materials, 20 Hz - 30 MHz
Delivery time upon request
On Request
1J10324
Wayne Kerr
1J10324
Test holder for SMD Bottom Contact, 4 terminals, for 6500 series
Delivery time upon request
On Request
1J1036
Wayne Kerr
1J1036
Test holder for components, 200A, 2 terminals, for series 3265
Delivery time upon request
On Request
1J10362
Wayne Kerr
1J10362
Test holder for SMD bottom contact, 200 A, 2 terminals, for series 3265
Delivery time upon request
On Request
3255B
Wayne Kerr
3255B
Inductance Analyzer, 20 Hz - 500 kHz, basic accuracy: 0.1%
Delivery time upon request
On Request
3255BL
Wayne Kerr
3255BL
Inductance Analyzer, 20 Hz - 200 kHz, basic accuracy: 0.1%
Delivery time upon request
On Request
3255BQ
Wayne Kerr
3255BQ
Inductance Analyzer, 20 Hz - 1 MHz, basic accuracy: 0.1%
Delivery time upon request
On Request

Options (6 products)

3260-B2
Wayne Kerr
3260-B2
BIN Handler option, isolated, for product series 3260
Delivery time upon request
On Request
3260-D
Wayne Kerr
3260-D
BIN Handler option, non-isolated, for product series 3260
Delivery time upon request
On Request
3260-G
Wayne Kerr
3260-G
Analysis / Graph Function option, for product series 3260
Delivery time upon request
On Request
3260-N
Wayne Kerr
3260-N
Insulation resistance option, for product series 3260
Delivery time upon request
On Request
3260-S
Wayne Kerr
3260-S
Faster DC Bias Current ramp up and down option, for product series 3260
Delivery time upon request
On Request
3260-T
Wayne Kerr
3260-T
LF Telecom Function option, for product series 3260
Delivery time upon request
On Request

About the Manufacturer

Wayne Kerr
Wayne Kerr was founded in London (GB) in 1946 and developed into one of the leading manufacturers of measuring instruments in the electronics sector worldwide. Today, you will find Wayne Kerr wherever the highest precision and reliability are required: in automotive engineering, component manufacturing, medical technology and, of course, in universities and other educational institutions.

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