CT6 is a high frequency current probe with a bandwidth of 250 kHz to 2 GHz for use with broadband oscilloscopes with an input impedance of 50 Ω. The probe is designed to meet the very high bandwidth, low inductance and small form factor requirements of high speed circuit design and test applications. The low inductance (< 3 nH) ensures that the load from the CT6 probe on the circuit under test is negligible. This is particularly important for circuit designs with low signal amplitude and high transmission speeds.
Typical applications include the development and production of read/write preamplifiers for disk drives. The probe is a closed circuit that can accommodate non-insulated wires with a diameter of up to 0.8 mm. Due to the maximum voltage of 30 V, CT6 meets the requirements of CAT I.
The CT6 current probe is intended for permanent or semi-permanent installation in a circuit. The probe consists of a current transformer with an integrated 50 Ω connection cable.
Differential current measurement:
Most true differential voltage amplifiers have a maximum bandwidth of around 100 MHz. The CT6 current probe can perform differential current measurements up to 2 GHz by passing two wires with opposing currents through the same core. The displayed result is the differential current.
Measurements of propagation delay:
Two CT6 current transformers with matching cables of equal signal transit times can be used
to measure the signal transit time between the input current and output current
of high-frequency components. The two outputs of the current samples are connected to the inputs of a dual-channel real-time sampling oscilloscope.
Any sample/cable/scope mismatch can be verified by passing the same signal current through both current samples and measuring the system delay time difference.
Application areas:
- Read channel design for data storage
- Silicon characterization
- High frequency analog design
- ESD-Testing
- Signal injection
- Differential current measurements
- Low repetition rate single-shot pulse measurements
- Propagation delay measurement