The Wide Bandgap Double Pulse Test (WBG-DPT option) application for your Tektronix 5 Series oscilloscope enables precise double pulse measurements to simplify testing.
Product Features:
- 16+ key measurements according to JEDEC and IEC standards
- Ability to test SiC or GaN devices as well as Si MOSFETs and IGBTs
- Specify pulse regions such as the first, second or multiple pulses of interest and correlate with the scalar results in the badge
- Annotate traces to show regions of interest
- Easily navigate the pulse region for multi-pulse use cases
- Unique edge refinement algorithm for analyzing noisy traces
- Programmatic Interface to all measurements and configurations enable full automation in test system applications
- Support of auto and user-defined reference levels for precise identification of start and stop regions
- Configuration of the hysteresis level on the gate source helps to avoid false edges
- Quickly add and configure measurements via the intuitive drag-and-drop user interface of the 4/5B/6B Series MSO
- Overlapping plot for reverse recovery (trr) measurement
- Search directions (forward, backward) for effective debugging of pulse regions
- Support for controlling the gate driver (AFG31000 series) to generate double pulse signals
- Deskew function for switching analysis
The application is based on the following standard references designed:
- Double Pulse Test (DPT)
- IEC 60747-9
- JEP182
- IEC 60747-8
- Diode Reverse Recovery
The following measurements are carried out:
- Low voltage switching parameters and diode reverse recovery on the high voltage side
- Switching parameters low voltage and high voltage side