Semiconductor and Component Test

Check here for parameter analyzers for characterizing materials, processes and semiconductor devices, source measure units for IV characterization of passive (currentless) components such as diodes, resistors and capacitors, and test systems for SiC (silicon carbide) and GaN (gallium nitride) power semiconductors. Find the right instrument for material and component characterizations in maintenance, design or quality control in our category Semiconductor and Component Test.

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517 products
1CM068A
On Request
Delivery time upon request
973-972-100
€6.05
Delivery time upon request
83059K
On Request
Delivery time upon request
HA-Z360
€425.00
Delivery time upon request
PZ2110A
On Request
1 in stock. Ready to ship in 1 business day
NGU-K103
€340.00
Ready to ship in 5 to 10 business days
NGU-K104
€340.00
Delivery time upon request
RS9010A-25
On Request
Delivery time upon request
934-062-104
€7.25
Delivery time upon request
1CR013A
On Request
Ready to ship in 5 to 10 business days
N1294A-031
On Request
3 in stock. Ready to ship in 1 business day
4200-PA
€2,090.00
Delivery time upon request
973-368-101
€3.85
Delivery time upon request
TA262
€71.00
Delivery time upon request
4211-SMU
On Request
Delivery time upon request
J7201A-001
On Request
Delivery time upon request
TA050
€65.00
Delivery time upon request
934-067-100
€6.95
Delivery time upon request
N9355C
On Request
Delivery time upon request
973-919-001
€35.75
Delivery time upon request
€20.00
Delivery time upon request
934-074-103
€7.25
Delivery time upon request
MI121
€18.00
Delivery time upon request
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