Semiconductor and Component Test

Check here for parameter analyzers for characterizing materials, processes and semiconductor devices, source measure units for IV characterization of passive (currentless) components such as diodes, resistors and capacitors, and test systems for SiC (silicon carbide) and GaN (gallium nitride) power semiconductors. Find the right instrument for material and component characterizations in maintenance, design or quality control in our category Semiconductor and Component Test.

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517 products
FLUKE HC120
€71.38 €86.00
Delivery time upon request
N1412A
On Request
Delivery time upon request
783539-01
€33.00
3 in stock. Ready to ship in 1 business day
1CM032A
On Request
Delivery time upon request
8490D
On Request
6 in stock. Ready to ship in 1 business day
N4697K
On Request
Delivery time upon request
ZZA-T34
€560.00
5 in stock. Ready to ship in 1 business day
4220-PGU
On Request
Delivery time upon request
N9910X-860
On Request
Delivery time upon request
AC220
On Request
Delivery time upon request
934-060-101
€4.95
5 in stock. Ready to ship in 1 business day
PZ2131A
On Request
Delivery time upon request
2657A-LIM-3
€3,540.00
Delivery time upon request
932-435-100
€4.95
Delivery time upon request
N1417A
On Request
Delivery time upon request
934-072-104
€7.15
Delivery time upon request
TA313
€25.00
Delivery time upon request
E5810B-300
On Request
2 in stock. Ready to ship in 1 business day
TP220-1
€25.73 €31.00
Delivery time upon request
TA342
€66.00
Delivery time upon request
8494G
On Request
2 in stock. Ready to ship in 1 business day
HA-Z364
€57.00
Delivery time upon request
J7201C-909
On Request
Delivery time upon request
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