Semiconductor and Component Test

Check here for parameter analyzers for characterizing materials, processes and semiconductor devices, source measure units for IV characterization of passive (currentless) components such as diodes, resistors and capacitors, and test systems for SiC (silicon carbide) and GaN (gallium nitride) power semiconductors. Find the right instrument for material and component characterizations in maintenance, design or quality control in our category Semiconductor and Component Test.

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518 products
PZ2100A
On Request
1 in stock. Ready to ship in 1 business day
3782-36-0
On Request
2 in stock. Ready to ship in 1 business day
NGU 401
€7,270.00
Delivery time upon request
P01102056
€146.00 €163.00
Ready to ship in 5 to 10 business days
NGU201
On Request
Delivery time upon request
2450
€7,030.00
2 in stock. Ready to ship in 1 business day
TRX-1100V-CONN
€118.00
Delivery time upon request
P01103081
€391.00 €435.00
Ready to ship in 5 to 10 business days
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3782-36-2
On Request
2 in stock. Ready to ship in 1 business day
TL224
On Request
Delivery time upon request
TP2-1
On Request
Delivery time upon request
B2902B
On Request
2 in stock. Ready to ship in 1 business day
3957
On Request
Delivery time upon request
2470
€12,200.00
5 in stock. Ready to ship in 1 business day
B2901BL
On Request
2 in stock. Ready to ship in 1 business day
4200A-SCS
On Request
Delivery time upon request
934-068-101
€7.25
Delivery time upon request
10834A
On Request
10 in stock. Ready to ship in 1 business day
B2910BL
On Request
Reordered - in stock. Delivery time on request
934-068-100
€7.25
Delivery time upon request
934-095-100
€8.25
Delivery time upon request
2606B
€30,600.00
Delivery time upon request
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