LANGER XF-R 3-1 | H-field probe, 30 MHz to 6 GHz

Name: XF-R 3-1 | H-field probe, 30 MHz to 6 GHz
Brand: LANGER
SKU: XF-R 3-1
Price: 474.1 EUR
Availability: OutOfStock

Manufacturer number: XF-R 3-1

Delivery time upon request

€474.10

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Langer XF-R 3-1 | H field probe, 30 MHz to 6 GHz.

Product features:

Frequency range: 30 MHz - 6 GHz
Resolution: ≈ 1 mm
Probe head dimensions: Ø ≈ 3 mm
Connection - output: SMA, female, jack
Weight: 15 g

Description

XF-R 3-1 | H-field probe, 30 MHz to 6 GHz

The XF-R 3-1 near-field probe is used to measure RF magnetic fields with high resolution directly on the component, e.g. in the area around pins and housings of ICs, traces, support capacitors and EMC components.

The XF-R 3-1 H-field probe has the same basic design as the XF-R 100-1 and XF-R 400-1 probes, but the resolution of the XF-R 3-1 is significantly higher. The H-field probe is suitable for measurements close to components in the area of high magnetic field strengths. It is not suitable for measurements at greater distances, such as those carried out with the XF-R 400-1 and the XF-R 100-1. The near-field probe is small and easy to handle. It has a sheath current attenuation and is electrically shielded. The near-field probe is connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe has an internal terminating resistor.

About the Manufacturer

LANGER

Langer EMV Technik was founded in 1998. The company is one of the top specialists in the field of electromagnetic compatibility (EMC).