LANGER XF-R 100-1 | H-field probe, 30 MHz to 6 GHz

Manufacturer number: XF-R 100-1

Langer XF-R 100-1 | H-field probe, 30 MHz to 6 GHz.

Product features:

  • Frequency range: 30 MHz - 6 GHz
  • Resolution: Ø ≈10 mm
  • Probe head dimensions: ≈ 10x10 mm
  • Connection - output: SMA, female, jack

Description

XF-R 100-1 | H-field probe, 30 MHz to 6 GHz

The XF-R 100-1 H-field probe is suitable for measuring assemblies, devices or cables at a distance of up to approx. 3 cm. Larger components can be identified as interference sources with the H-field probe. The magnetic field probe offers a very high bandwidth and linearity.

The XF-R 100-1 is a passive near-field probe. The diameter of its probe head and therefore its sensitivity lie between the XF-R 400-1 (25 mm) and XF-R 3-1 (3 mm) near-field probes. The near-field probe is small and handy. It has a sheath current attenuation and is electrically shielded. The near-field probe is connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe has an internal terminating resistor.

About the Manufacturer

LANGER
Langer EMV Technik was founded in 1998. The company is one of the top specialists in the field of electromagnetic compatibility (EMC).

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