LANGER XF-B 3-1 | H-field probe, 30 MHz to 6 GHz

Manufacturer number: XF-B 3-1

Langer XF-B 3-1 | H field probe, 30 MHz to 6 GHz.

Product features:

  • Frequency range: 30 MHz - 6 GHz
  • Resolution: ≈ 2 mm
  • Probe head dimensions: Ø ≈ 4 mm
  • Connection - output: SMA, female, jack
  • Weight: 15 g

Description

XF-B 3-1 | H-field probe, 30 MHz to 6 GHz

The measuring coil of the H-field probe XF-B 3-1 is arranged orthogonally to the probe shaft. When the probe head is positioned vertically, the measuring coil lies directly on the surface of the printed circuit board. This enables measurements to be taken in hard-to-reach areas of the PCB surface, e.g. between large components of switching regulators.

The XF-B 3-1 is a passive near-field probe. It detects magnetic field lines that emerge orthogonally from the measurement object. Magnetic field lines that enter the probe from the side are not detected. The difference to the H-field probe XF-R 3-1 is that the coil is rotated by 90°. The near-field probe is small and easy to handle. It has a sheath current attenuation and is electrically shielded. The near-field probe is connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe has an internal terminating resistor.

About the Manufacturer

LANGER
Langer EMV Technik was founded in 1998. The company is one of the top specialists in the field of electromagnetic compatibility (EMC).

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