The Set SX1 contains three passive near-field probes for measurement-accompanying measurement of high-frequency E-fields and magnetic fields from 1 GHz to 10 GHz. The probe heads of the Set SX enable measurements to be carried out close to the electronic assembly, for example on individual IC pins, conductor tracks, components and their connections for the localization of interference emission sources. The field orientation and field distribution on the electronics module can be determined by appropriate guidance of the near-field probes. The near field probes are small and handy. You have a sheath current damping. The magnetic field probes are electrically shielded. The near-field probes are connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. All probes have an internal terminating resistor.
High clock rates, such as over 3 GHz, approach 10 GHz at the 3rd harmonic. These harmonics are decoupled from RF sources on the module, such as conductor sections, ICs and other components. Other structural parts of the assembly can be excited to vibrate and lead to interference. Given the high internal fundamental frequency of today's modules, the measurement of harmonic frequency multiples is a step towards safe EMC.
Scope of delivery:
- 1x SX-E 03, E-field probe 1 GHz to 10 GHz
- 1x SX-B 3-1, H field probe 1 GHz to 10 GHz
- 1x SX-R 3-1, H field probe 1 GHz to 10 GHz
- 1x SMA-SMA 1 m, measuring cable SMA-SMA
- 1x Case 4, system case near-field probes