The measuring coil of the SX-B 3-1 H-field probe is arranged orthogonally to the probe shaft. When the probe head is positioned vertically, the measuring coil lies directly on the surface of the printed circuit board. This enables measurements to be taken in hard-to-reach areas of the PCB surface, e.g. between large components of switching regulators.
The SX-B 3-1 is a passive near-field probe. It detects magnetic field lines that emerge orthogonally from the measurement object. Magnetic field lines that enter the probe from the side are not detected. The difference to the SX-R 3-1 H-field probe is that the coil is rotated by 90°. The near-field probe is small and easy to handle. It has a sheath current attenuation and is electrically shielded. The near-field probe is connected to a spectrum analyzer or an oscilloscope with a 50 Ω input.