With the small probe head of the RF-R 0.3-3, RF magnetic fields can be measured with very high resolution and the smallest components can be identified as sources of interference. The small probe head is also suitable for measuring in areas that are difficult to access, e.g. in the vicinity of IC pins.
The RF-R 0.3-3 is a passive near-field probe. It has the same basic design as the RF-R 50-1 and RF-R 400-1 H-field probes. The resolution of the RF-R 0.3-3 is significantly higher. The H-field probe is suitable for measurements close to components in the area of high magnetic field strengths. The coil openings of the RF-R 0.3-3 are marked with white dots. Due to its small design, measurements in hard-to-reach places such as between components are very easy. The near-field probe is small and easy to handle. It has a sheath current attenuation and is electrically shielded. The near-field probe is connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe does not have an internal 50 Ω terminating resistor.