The interference pulse of the P23 is coupled via its tip into the digital IC inputs to be tested, such as reset, clock, quartz or the corresponding signal lines. The coupling takes place capacitively inside the field generator. The tip of the P23 mini burst field generator is galvanically connected to the pin or signal line to be tested. The extremely thin tip makes the P23 suitable for testing the finest structures.
Conventional generators and test stations can be used to determine whether a device complies with the legally required standard values for interference immunity. It is not possible to precisely localize weak points on the assembly. In order to find and eliminate these in the simplest possible way at the point of action on the circuit board, precise information about the position, sensitivity and type of action mechanism (E or B field sensitivity) of the weak point is required. Thanks to their handy format, the mini burst field generators are immediately at hand. Investigations can be carried out directly at the electronics developer's workplace.