The LF-R 3 near-field probe is used to measure RF magnetic fields with high resolution directly on the module, e.g. in the area around pins and housings of ICs, traces, support capacitors and EMC components.
The LF-R 3 is a passive near-field probe. It has the same basic design as the LF-R 50 and LF-R 400 probes and has the highest resolution of these three probes. The H-field probe is suitable for measurements close to components in the area of high magnetic field strengths. It is not suitable for measurements at greater distances, such as those carried out with the LF-R 400 and LF-R 50. The near-field probe is small and easy to handle. It has a sheath current attenuation and is electrically shielded. The near-field probe is connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe does not have an internal 50 Ω terminating resistor.