The near-field microprobe is used for high-resolution measurement of electrical near-fields. The following measurements can be carried out with the ICR E probe:
- Surface scan via IC according to IEC 61967-3
- Volume scan via IC
- PIN scan
A preamplifier is integrated in the probe housing and is powered by the bias tee.
The ICR near-field microprobes are subjected to a quality check before delivery. Various measurements are carried out on reference arrangements and the resulting correction characteristics are generated. Two different correction characteristics are determined:
- Standardized correction characteristic
- E-field correction characteristic
Attention: Due to its construction, the ICR probe is sensitive to impact and is supplied with transport and handling protection.