Keysight B2901B | Demonstration unit - Precision source measuring unit, SMU, 1-channel, resolution 100 fA / 100 nV, output 210 V / 3 A DC, 10.5 A pulsed (AT2029_2111_V).

Manufacturer number: AT2029_2111_V

Special item - Keysight B2901B | Precision source measurement unit, Source/Measure Unit (SMU), 1-channel, resolution 100 fA / 100 nV, output max. 210 V / 3 A DC, 10.5 A pulsed. (AT2029_2111_V).

  • 1 channel
  • Smallest resolution d. Source: 1 µV / 1 pA, 5½ digits
  • Smallest measurement resolution: 100 nV / 100 fA, 6½ digits
  • Maximum output voltage / current: 210 V / 3 A DC, 10.5 pulsed
  • Sampling rate: 50,000 Sa/s (min. time interval 20 µs)
  • Integrated sweep and AWG measurement functionality (arbitrary waveform generator): for arbitrary functions with up to 100,000 steps
  • Sweep modes: linear, logarithmic, list
  • 4-wire measurement function for precise low-voltage measurements
  • Buffer memory for up to 100,000 Measured values
  • Innovative GUI (Graphical User Interface): for intuitive I-V measurements without PC programming
  • Display modes: Single, diagram
  • SCPI programming for easy test code migration
  • Software options for the measurement application: BenchVue, Quick lV, EasyEXPERT group+, Web browser (Graphical Web Interface, for basic applications)
  • Interfaces: GPIB, LAN, 2x USB 2.0 (host, device), digital I/O
  • Power supply: 90 to 264 V / 47 to 63 Hz
  • Dimensions: W 260 × H 180 × D 480 mm (incl. Handle and feet)
  • Weight: 6 kg
  • Warranty: 3 years

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Description

B2901B | Demonstration unit - Precision source measuring unit, SMU, 1-channel, resolution 100 fA / 100 nV, output 210 V / 3 A DC, 10.5 A pulsed (AT2029_2111_V).

Voltage and current measurements with fast, precise measurement results: The B2901B Source Measure Unit (SMU) from Keysight's B2900B/BL series is a compact, precise and cost-effective solution for the development area and the test field. The precision source measurement unit is particularly suitable for I-V measurement applications that require particularly high measurement resolution and accuracy. By integrating source and measurement unit in one device, your test throughput increases.

Main features:

  • Integrated function as source and measurement device: easy and accurate measurement of current and voltage with just one device and without manually changing the connections
  • Wide current and voltage measurement range: for a wide range of applications in research and development, training and production including standardized high voltage and high current measurements
  • Outstanding measurement performance: very high source and measurement resolution for precise low-level measurements as well as high measurement speed for increased test throughput and cost efficiency
  • Innovative GUI and 4.3-inch LCD color display: graphical and numerical representation of the measurement results simplifies troubleshooting and characterization
  • Integrated AWG measurement functionality: Arbitrary waveform generation for waveforms with up to 100,000 steps and sweep functions support the characterization of devices depending on the applied voltage/current
  • SCPI programming for device control: two SCPI command sets, conventional and standard, allow compatibility with older SMU models and maximize the performance of the B2900B/BL series

The B2900B/BL SMU series offers a total of six models with an output voltage of up to 210 V and a maximum output current of 3 A DC or 10.5 A pulsed. This enables a wide range of applications with just a single device. The high measurement resolution of up to 10 fA / 100 nV enables precise characterization of even weak signal events. The color display supports graphic and numerical displays. Your measurement results are therefore easy to read, which makes troubleshooting easier and can increase productivity and cost efficiency.

Application examples:

  • Testing of optical components: laser/photodiodes
  • Testing of organic components: OLED (Organic Light Emitting Diode)
  • Testing of solar cells and batteries
  • Characterization of materials from nanotechnology
  • Testing of power management devices: linear regulator LDO (low-dropout)
  • Testing of semiconductor components: diodes, laser diodes, LEDs, sensors, FETs, transistors, ICs, resistors, varistors, thermistors, switches, etc.

Please note: Special items / clearance sales are in their original packaging and unused. All special items have a 1 year guarantee. Subject to prior sale. The configuration of a special item cannot be changed.

Call us, we will be happy to advise you personally:

+49 (0)7121 / 51 50 50

Alternate products (1 products )

Alternate products (1 product )

Keysight B2901B
Precision source measuring unit, SMU, 1-channel, resolution 100 fA / 100 nV, output 210 V / 3 A DC, 10.5 A pulsed
Reordered - in stock. Delivery time on request
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About the Manufacturer

Keysight
dataTec and Keysight Technologies have had a strong partnership since 1999. No other company offers such a wide range of measurement technology, testing solutions, and solutions for our connected world. With Keysight's measuring instruments, you are also well-equipped for today's and tomorrow's tasks.

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