#statusMessage#
Do you want to start the compare now?
#statusMessage#
Do you want to start the compare now?
With the increasing importance of renewable energies in the wake of climate change, solar energy is moving further into ...
The complexity of military radios and the often harsh weather conditions have a negative impact on the reliability of ra...
Automation with thermal imaging technology has proven to be a reliable solution for quality control in various industrie...
In diesem exklusiven Whitepaper erfahren Sie, wie Sie mit der richtigen Messtechnik arbeiten: ✔ Sie realisieren ein Test...
Manufacturer number: 2657A
On Request
The Source Measure Unit (SMU) 2657A with a high output voltage of up to 3 kV, a high power of up to 180 W and a low output current of max. 120 mA was specially developed for the characterization and testing of high-voltage electronics and power semiconductors such as diodes, FETs and IGBTs as well as other components and materials. The Source Meter is used in the areas of research, development and production testing, where high performance, measuring precision, speed and application flexibility are required. For this, 2654A offers the function of a four-quadrant voltage and current source / load with an integrated 6½-digit digital multimeter. The Source Measure Unit is used as:
Using TSP-Link technology, several 2657A models can be connected to other 2600B series SMUs to form a larger integrated system with up to 32 devices (max. 64 channels). The built-in 500 ns trigger control guarantees precise timing and optimizes channel synchronization. The fully isolated, independent channels enable real SMU-per-pin tests.
A key advantage of the SMU 2657A are the two available measurement modes, which enable precise characterization of transient and stationary behavior, including rapidly changing thermal effects. In order to minimize switching times, a separate analog-digital converter is used in each measuring mode, one for current and one for voltage. Both converters scan simultaneously to enable the source data (output current and voltage) to be read back accurately without reducing the test throughput. This allows changes in the current and voltage behavior to be recorded simultaneously and very quickly. The "Digitize" mode achieves a conversion time of 1 µs per scan for the two 18-bit A / D converters for the simultaneous acquisition of voltage and current transients. In the "Integrate" measuring mode, the two 22-bit A / D converters enable an even more precise measurement of voltage and current.