The High Power SourceMeter 2651A is specially designed for the characterization and testing of high-performance electronics. The SMU supports you in improving your productivity in development, production and quality control. The system 2651A is used, among other things, for testing high-performance LEDs, power semiconductors, DC-DC converters, batteries, solar cells and other high-performance components, modules and sub-assemblies.
2651A is a highly flexible four-quadrant voltage and current source / load with an integrated, 6½-digit digital multimeter. The Source Measure Unit is used as:
- Precision power supply with V and I feedback
- Precision load for the characterization of semiconductors
- V or I waveform generator
- V or I pulse generator
- 6½-digit digital multimeter for measurements of DCV, DCI, resistance and power
Using TSP-Link technology, several 2651A models can be connected to other 2600B series SMUs to form a larger integrated system with up to 32 devices (max. 64 channels). The built-in 500 ns trigger control guarantees precise timing and optimizes channel synchronization. The fully isolated, independent channels enable real SMU-per-pin tests.
The voltage range can be expanded from 40 V to 80 V in series connection of two 2651A devices. The built-in intelligence simplifies testing by addressing the units as a single instrument and thus offering an outstanding dynamic range from 100 A to 1 pA - for tests over a very wide range of power semiconductors or other components.
Digitize or integrate:
A major advantage of the SMU 2651A are the two available measurement modes, which enable precise characterization of transient and stationary behavior, including rapidly changing thermal effects. In order to minimize switching times, a separate analog-digital converter is used in each measuring mode, one for current and one for voltage. Both converters scan simultaneously to enable the source data (output current and voltage) to be read back accurately without reducing the test throughput. This allows changes in the current and voltage behavior to be recorded simultaneously and very quickly. The "Digitize" mode achieves a conversion time of 1 µs per scan for the two 18-bit A / D converters for the simultaneous acquisition of voltage and current transients. In the "Integrate" measuring mode, the two 22-bit A / D converters enable an even more precise measurement of voltage and current.
High speed pulses:
During the test, the 2651A minimizes the undesirable effects of the self-heating of the DUT (Device Under Test) by means of short pulses (100 µs) for control and measurement. In addition, the pulse width can be expanded from 100 μs to DC and the pulse duty factor from 1 to 100% by programming. One device can generate pulses of up to 50 A. If two devices are connected in parallel using TSP technology (Test Script Processor), pulses up to 100 A can be generated without the usual power and / or channel limitation that mainframe-based systems offer.