Detectus HRE-43 / 6G | Near field scanner 4D, EMC, high resolution, HRE-43 SE 6 GHz, scanning area 390 x 290 x 130 mm

Name: HRE-43 / 6G | Near field scanner 4D, EMC, high resolution, HRE-43 SE 6 GHz, scanning area 390 x 290 x 130 mm
Brand: Detectus
SKU: HRE-43/6G
Availability: InStock

Manufacturer number: HRE-43/6G

Delivery time upon request

On Request

or choose one of the following options:

Request a quote Product inquiries Request education-price

Detectus HRE-43 / 6G | HRE 43 High Resolution 4D EMC / near-field scanner, 390 x 290 x 130 mm, 6 GHz.

Accuracy: +/- 0.02 mm
Min. Step size: 0.025 mm
Including near-field probe set and preamplifier up to 3 GHz
IC option with high resolution inspection camera
Extended rotation function of the near-field probe
Measurable volume: 390 x 290 x 130 mm
Movement in XYZ direction: 390 x 290 x 130 mm
Interfaces: Ethernet, adapter RS-232 or USB to RS-232
Weight: 125 kg

Technical Data

Article number:	HRE-43/6G
Bandwidth (GHz):	6
Dimensions (L x W x H) (mm):	810 x 780 x 850
Interfaces:	RS-232, LAN
Model:	HRE-43/6G
Scanning area (X,Y,Z) (mm):	390 x 280 x 130
Scan type:	3D
Weight (kg):	150
min. Step size (mm):	0.025

Documents & Downloads

Datasheet

pdf | 0.85 MB

Description

HRE-43 / 6G | Near field scanner 4D, EMC, high resolution, HRE-43 SE 6 GHz, scanning area 390 x 290 x 130 mm

The high-resolution HRE series from Detectus carries out EMI scans in high-precision steps of just 25 μm. The IC option also offers a high-resolution real-time inspection camera and special, high-resolution ICR near-field probes. To complete the scanner system, you need a PC and a spectrum analyzer.

The scanners of the HRE4x series are equipped with an extended rotation function for near-field probes. The rotation around the probe axis ensures that all field maxima are fully recorded despite different sensitivities of the probe at different positioning angles, be it conductor tracks on circuit boards or bonding wires in a chip.

Product features:

Measurement in 4 dimensions: XYZ axes and rotation of the near-field probe for precise detection of the E-field
IC option: microscopic high resolution of probe and DUT via camera (> 10 µm / px)
Automatic probe calibration via beacon for reproducible measurement results
3D surface measurement: Import of STL files to take into account the construction heights of a test object
Multiscan measurements allow plots for any frequency within the measured frequency range
Including temperature measurement
Software option for immunity measurements

Accessoires (1 products)

Accessoires (1 product)

Detectus
SUSS

Software SUSS software subscription for 1 year

Delivery time upon request

€600.00

News and Knowledge

Measurement Tip

Spectrum analysis and EMC.

The spectrum analyzer is an indispensable piece of measuring equipment in development, production or quality assurance. ...

14/12/2022

Reading time 4 Min.

1022

About the Manufacturer

Detectus

For more than 20 years, the Swedish company Detectus has been developing, manufacturing, and distributing first-class EMC test systems. In close contact with its customers, Detectus develops flexible and user-friendly test equipment that meets the requirements of daily EMC testing.