The Chroma 52405-5-3 of the Chroma 52400 series is a high-precision Source Measure Unit (SMU) PXI module. The SMU is designed for highly accurate source or load simulations with precise voltage and current measurements. It combines four-quadrant operation with precision and high-speed measurement.
The Chroma 52405-5-3 is characterized by the following features:
- 16 selectable control bandwidths to ensure high output speed and stable operation
- Multiple source and measurement ranges with an 18-bit DAC/ADC to achieve the best resolution and accuracy with a sampling rate of up to up to 100 K s/S
- Programmable internal series resistance for battery simulation
- ± power, ± measuring and ± protective lines to avoid leakage current and reduce the Settlement Time
The Source Measure Unit features a patented hardware sequencer device that uses deterministic timing to control each SMU. The sequencer's integrated memory can store up to 65,535 sequencer commands and 32k measurement samples per channel. This enables cross-module and board synchronization as well as latency-free output control and measurement.
The Chroma 52405-5-3 is ideal for many parametric test applications, from ICs, dual-leaded components such as sensors, LEDs, laser diodes and transistors to solar cells, batteries and many other electronic devices.
Product features:
- High precision source Measure Unit (SMU) Card
- Based on the PXI platform
- Highly accurate source or load simulations with precise voltage and current measurements
< br/>- Combines four-quadrant operation with precision and high-speed measurement
- 16 selectable control bandwidths
- Multiple source and measurement ranges with an 18-bit DAC/ ADC
- Sampling rate of up to 100 K s/S
- Programmable internal series resistance for battery simulation
- ± force -, ± measurement and ± protection lines
- Patented hardware sequencer
- Integrated memory of the sequencer can store up to 65,535 sequencer commands and 32 k measurement samples per channel
- Cross-module and cross-card synchronization as well as latency-free output control and measurement
- APIs for C, C#, LabView, LabWindows and many soft front panels
- Compatibility with PXIe and hybrid chassis
- Ideal for many parametric test applications