The Chroma 11090-030 RF LCR Meter is a high-frequency evaluation solution for passive components such as SMD chip inductors and RF filters. With a test frequency of up to 300 MHz, this device not only meets the increasing demand for nominal frequency testing of components such as POL or small DC-DC converters, but also reveals quality anomalies that can only be detected at extremely high frequencies.
The device covers measurement parameters such as Z, θz, Y, θy, R, X, G, B, Ls, Lp, Cs, Cp, Rs, Rp, D, Q and other primary and secondary parameters , which are required for testing various passive components. The wide test frequency range from 100 kHz to 300 MHz, using RF current-to-voltage conversion technology, provides a wider impedance measurement range than network analyzers and a higher frequency measurement range than auto-balancing bridge technology. This makes it ideal for the analysis of passive component properties at various frequencies by R&D and quality assurance units.
The 11090-030 has an integrated signal generator and is characterized by its basic measurement accuracy of 0.8%, which ensures highly stable and reliable measurement results. The fast measurement speed of 0.5ms greatly increases production efficiency when used in an automated environment.
The SMD test attachment is compatible with various types of small SMDs and uses improved downward pressure -Activation method that can be rotated 90 degrees and only requires three steps to change the DUT (actual test time is about 40 seconds). This accelerates testing speed by reducing the time for changing different sized DUTs and eliminating the need for repeated reassembly of device guides, which also reduces wear and maintenance costs.
The Chroma 11090 -030 uses the RF-IV measurement method to measure the voltage and current of the device under test (DUT). Compared to traditional network analyzers, the 11090-030 provides more accurate measurements over a wider impedance range (100mΩ~5kΩ) and is capable of measuring inductance values in the nH range.