Chauvin Arnoux MX0650-Z | MX650 clamp meter, digital 4-digit mean AC, 1000A

Name: MX0650-Z | MX650 clamp meter, digital 4-digit mean AC, 1000A
Brand: Chauvin Arnoux
SKU: MX0650-Z
Price: 294.0 EUR
Availability: OutOfStock

Manufacturer number: MX0650-Z

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€294.00

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MX650 multimeter from Metrix (Chauvin-Arnoux Group).

4000 digit display
Bargraph 42 segments
Enclosure Ø: 40 mm
AC currents (pliers): from 0.05 A to 1000 A.
AC voltages: 0.5 to 750 V
DC voltages: 0.2 to 1000 V.
Resistances: from 0.2 Ω to 4 kΩ
Frequency (for A measurements): 10 Hz to 4 kHz
Frequency (for V measurements): 10 Hz to 10 kHz
Continuity test and diode test
HOLD function; PEAK detection (1 ms); MIN; MAX; REL
Security acc. EN 61010-1, Cat.III, 600 V, Schmm. 2nd

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Technical Data

Article number:	MX0650-Z
Current measuring range AC/DC:	AC 50 mA - 1000 A
Dimensions (L x W x H) (mm):	246 x 93 x 43
Diode test / continuity test:	Yes / Yes
Direction of rotation:	No
Enclosure (mm):	35
Frequency measuring range:	10 Hz - 10 kHz
Hold:	Yes
Measurement method:	Average
Min. / Max. Measurement:	Yes / Yes
Model:	CA MX0650-Z
Power factor:	Nein
Power measurement (active / apparent / reactive):	No / No / No
Resistance measuring range:	200 mΩ - 399,9 Ω
Temperature measuring range:	No
Voltage measuring range AC/DC:	500 mV - 750 V / 200 mV - 1000 V
Weight (kg):	0.4

Documents & Downloads

Datasheet

pdf | 2.27 MB

Description

MX0650-Z | MX650 clamp meter, digital 4-digit mean AC, 1000A

The multimeter MX 650 is particularly suitable for AC high-voltage measurements at high voltages and has all multimeter functions: AC / DC voltages, resistors, diode test, continuity test, frequency measurement for voltages and currents. It is suitable for large cable diameters of up to 36 mm, lies perfectly in the hand and is extremely easy to read.

About the Manufacturer

Chauvin Arnoux

Chauvin Arnoux stands for highest quality and innovative, highly reliable test equipment in the fields of electrical safety testing, measurement of electrical quantities, power measurement, energy and fault analysis.