Keysight B2981B | Femto- / picoammeter 6.5 digits, 0.01 fA - 20 mA
Manufacturer number: B2981B
On Request
Keysight B2981B | Femto / pico ammeter, from 0.01 fA to 20 mA, 6.5 digits.
- Effective measurement resolution: 0.01 fA
- Current measuring ranges: 2 pA to 20 mA
- Graphic, color display with 6.5 digit numerical display
- Smallest supply voltage: <20 µV in the smallest current measuring range
- Up to 20,000 measurements / s
- Measured value memory for up to 100,000 measurements
- Graphical representation of the measured values (curve progression over time), numerical representation of the measured values, histograms, statistics, trend analysis
- Simple and automatic settings for optimal measuring range selection and for the measuring time window
- Optional: Test setup Integrity Checker function for identifying noise sources in the test setup
- Interfaces: USB on front panel and back panel, LAN, GPIB, LXI
- Via USB front panel interface: measurement data storage, storage and recall of device settings
- Free PC software for device control
- Dimensions: Height: 88 mm (2U), width: 213 mm (1/2 width), depth: 348 mm
- Weight: 4.3 kg
- Guarantee: 3 years
Technical Data
Article number: | B2981B |
---|---|
Current measuring range DC: | 2 pA - 20 mA |
Dimensions (L x W x H) (mm): | 374 x 261 x 104 |
Diode test / continuity test: | No / No |
Display: | 4.3", graphic |
Interfaces: | LAN, USB, GPIB |
Measurements per second: | 20000 |
Model: | B2981B |
Number of positions: | 6.5 |
Special features: | Charge measurement |
Temperature measurement: | No |
Weight (kg): | 4.9 |
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Description
B2981B | Femto- / picoammeter 6.5 digits, 0.01 fA - 20 mA
The femto / pico ammeter of the B2900B series is unique, with which you can safely measure up to 0.01 fA (f femto = 10 to the power of -15). With additional properties, this femto ammeter leaves all other competing models far behind. With a resolution of 0.01 fA (femto ampere), especially with the new technologies in semiconductor technology, nanotechnology and when researching new insulation materials in material technology, very small currents can be reliably measured and detected.
A characteristic of this is that this device has an extremely low level of noise so that such small currents can be measured at all. With the approx. 11 cm (diagonal) colored graphic display, measurement curves or histograms can be displayed in order to estimate the measured values or to show trends. Of course, the measured values can also be displayed numerically. Statistics can also be applied to the recorded measured values without the need for a PC.
With such low currents, the measuring lines and the measuring setup are also of special importance. The device supports the fact that the measuring cables, measuring connections and measuring receptacles also meet the requirements for a reliable measurement. The Setup Integrity Checker software compares the noise level of different cables and measurement recordings. The noise sources in the measurement setup can then be identified and eliminated.
In addition, the device offers additional measuring aids that enable unskilled personnel to carry out correct measurements.
Areas of application for the B2980B series:
- Materials research (biomaterials, ceramics, elastomers, films, dielectrics, electromechanical materials, magnetic materials, graphites, metals, organic materials, nano-materials, polymers, semiconductors, etc.)
- Electronic components (capacitances, resistors, diodes, sensors, transistors incl. TFT and CNT, optoelectronic components, solar cells, etc.)
- Electronic and non-electronic systems (ion beam, electron beam, sensitive sensor systems, particle measurements, embedded systems, etc.)