XF1 | Near field probe set XF1, 30 MHz to 6 GHz 4 H field probes, 1 E field probe, cable SMA-SMA
The probes from the XF1 set contain electrically shielded measuring heads, which were designed for high-frequency magnetic field measurements on electronic assemblies, components and IC pins.
The passive probes are connected to the 50 ohm input of a spectrum analyzer via cables with SMA connectors and enable comparative magnetic field and current measurements in the frequency range from 30 MHz to 6 GHz.