The H-field probe XF-U 2.5-1 is a near-field probe. It is used to selectively detect the HF current in conductor runs, SMD components and IC pins. The probe head has a magnetically active gap of approx. 0.5 mm width. To measure, the probe is placed with the gap on traces, IC connections or capacitor connections.
The XF-U 2.5-1 is a passive near-field probe. It is suitable for small SMD components (pins). The near-field probe is small and handy. It has a sheath current attenuation and is electrically shielded. The near-field probe is connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe has an internal terminating resistor.
