The H-field probe XF-R 400-1 has a high sensitivity due to its large diameter (25 mm) and is suitable for measurements at a distance of up to 10 cm around assemblies and devices.
The XF-R 400-1 is a passive near-field probe. It has the same basic design as the XF-R 100-1 and XF-R 3-2 probes. The near-field probe is small and easy to handle. It has a sheath current attenuation and is electrically shielded. The near-field probe is connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe has an internal terminating resistor.