The XF-R 100-1 H-field probe is suitable for measuring assemblies, devices or cables at a distance of up to approx. 3 cm. Larger components can be identified as interference sources with the H-field probe. The magnetic field probe offers a very high bandwidth and linearity.
The XF-R 100-1 is a passive near-field probe. The diameter of its probe head and therefore its sensitivity lie between the XF-R 400-1 (25 mm) and XF-R 3-1 (3 mm) near-field probes. The near-field probe is small and handy. It has a sheath current attenuation and is electrically shielded. The near-field probe is connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe has an internal terminating resistor.
