The near-field probe detects the electric fields that couple out of the measurement objects (ICs). The flanks of the probe head are shielded so that any E-field coming in from the side is not measured. The sensitivity of the near-field probe enables measurements at a distance of 0.5 mm to 10 mm above ICs and assemblies.
The XF-E 09s is a passive near-field probe. It has the same basic design as the XF-E 04s probe. To measure, the E-field probe is guided over or placed on the components or areas of the printed circuit board. The top and sides of the probe head are electrically shielded. The E-field probe has a sheath current attenuation. The near-field probe is connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The E-field probe has an internal terminating resistor.
