The SX-R 20-1 set contains a passive near-field probe for measuring high-frequency magnetic fields up to 20 GHz during development. The probe head of the SX-R 20-1 enables measurements close to the electronic assembly, e.g. on individual IC pins, traces, components and their connections to localize sources of interference. The field orientation and field distribution on the electronic assembly can be determined by appropriate guidance of the near-field probe. The near-field probe is small and easy to handle. It has a sheath current attenuation and is electrically shielded. The near-field probe is connected to a spectrum analyzer or an oscilloscope with 50 Ω input.
