The electrode in the underside of the probe head of the RF-E 05 is approx. 0.5 mm wide. This allows e-fields from clocked lines, IC pins or smaller components to be localized very precisely. The RF-E 05 probe was developed for the Langer Scanner.
The RF-E 05 is a passive near-field probe. It has the same basic design as the RF-E 02 and RF-E 10 probes. In contrast to the RF-E 02, it detects E-field from very small areas. The RF-E 05 enables the more precise cause of the electrical interference field to be detected. For measurement, the E-field probe is guided or placed over the components or areas of the printed circuit board. The near-field probe is small and easy to handle. It has a sheath current attenuation and its upper side is electrically shielded. The near-field probe is connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The E-field probe does not have an internal 50 Ω terminating resistor.
