The electrode on the underside of the probe head of the RF-E 04 detects the electric fields that clocked lines and ICs emit. The sensitivity of the probe enables measurements at a distance of 0.5 mm to 10 mm above the module. The RF-E 04 probe has been developed for the Langer Scanner.
The RF-E 04 is a passive near-field probe. It has the same basic design as the RF-E 03 and RF-E 09 probes. The small square electrode surface of the RF-E 04 can be used to detect the exact cause of electrical interference fields. For measurement, the E-field probe is guided or placed over the components or areas of the printed circuit board. The near-field probe is small and easy to handle. The top of the probe is electrically shielded. It has a sheath current attenuation. The near-field probe is connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The E-field probe does not have an internal 50 Ω terminating resistor.
