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Manufacturer number: GSP-9330
Amplitude range: | +33 dBm to -122 dBm |
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Article number: | GSP-9330 |
DANL Displayed Average Noise: | ca. -122 dBm |
Demodulations: | AM, FM |
Detectors: | Peak, RMS, Quasi-Peak |
Dimensions (L x W x H) (mm): | 100 x 350 x 210 |
Dynamics: | 155 dB |
Filter bandwidths: | 1 Hz - 1 MHz in 1-3-10 sequence, EMI 200 Hz, 9 kHz, 120 kHz, 1MHz |
Frequency stability: | 1ppm |
Interfaces: | USB, LAN, RS-232 Optional: GPIB |
Measurement functions: | AM/FM Demodulation & Analysis, Built-in P1dB point, Harmonic, Channel Power, N-dB Bandwidth, OCBW, ACPR, SEM, TOI, CNR, CTB, CSO, Noise Marker, Frequency Counter, Time Domain Power, Gated Sweep |
Model: | GSP-9330 |
Resolution bandwidth: | 1Hz |
SSB phase noise: | -88 dBc/Hz @ 1 GHz (10 kHz carrier offset) |
Screen size: | 21,3 cm |
Screen type: | 800 x 600, LCD |
Special features: | optional battery operation |
Sweep: | linear |
Tracking-Generator: | optional |
Warranty (years): | 2 |
Weight (kg): | 4.5 |
max. Frequency range (GHz): | 3.25 |
min. Frequency range (kHz): | 9 |
This inexpensive spectrum analyzer GSP-9330 with very strong performance data from GW Instek offers a bandwidth from 9 kHz to 3.25 GHz. With this analyzer, spectra can be recorded and assessed very quickly - a spectrum sweep can be recorded within 204 µs, which means that modulation signals can be verified very quickly. Characteristic are not only the fast sweep but also the signal demodulation functions. In addition to the usual AM / FM demodulation and analysis, the GSP9330 can also analyze digital modulation types such as ASK / FSK (Amplitude Shift Keying / Frequency Shift Keying) and 2FSK (Binary FSK / Binary Frequency Shift Keying).
EMC (Electromagnetic Compatibility) and EMI (Electromagnetic Interference) are becoming increasingly important, as is EMS (Electromagnetic Susceptibility). This spectrum analyzer can also be used for such measurements in the ongoing development process. For this purpose, the device is equipped with the corresponding EMC pre-test functions. With the integrated solution procedures for these EMC pre-tests, product development times can be significantly reduced.
One of the features of this device is that the display can be divided for the result display - for the topographic as well as for the spectrographic display form.