Chauvin Arnoux P01120415 | MN89 current probe, 4 mm, 240 A 40 Hz - 10 kHz, U-Out

Name: P01120415 | MN89 current probe, 4 mm, 240 A 40 Hz - 10 kHz, U-Out
Brand: Chauvin Arnoux
SKU: P01120415
Price: 239.0 CHF
Availability: OutOfStock

Manufacturer number: P01120415

Delivery time upon request

CHF 239.00

plus VAT. CHF 258.36 VAT plus shipping costs

or choose one of the following options:

Product inquiries

Chauvin Arnoux P01120415 | Clamp current transformer MN89 0.5 ... 240 A AC, bandwidth 40 Hz ... 10 kHz, V-Out.

Nominal current: 0.5… 240 A AC
Output signal: 20 V DC
Output / input ratio: 100 mV DC / A AC
Bandwidth: 40 Hz ... 10 kHz
Inaccuracy: ≤ 2%
Systems up to CAT III 600 V or CAT IV 300 V
Output: via cable and plug (Ø4 mm, isolated)

Manufacturer-independent

Wide variety of brands from dataTec.

To the brands

Large product portfolio

All the highlights of dataTec Switzerland at a glance.

Download here

Demonstration & Consulting

Sales and technical support close to you.

Start request

Documents & Downloads

Datasheet

pdf | 0.76 MB

Description

P01120415 | MN89 current probe, 4 mm, 240 A 40 Hz - 10 kHz, U-Out

The Chauvin Arnoux current clamp converter MN89 measures alternating currents from 0.5 A to 240 A AC and has a bandwidth of 40 Hz to 10 kHz. The compact and ergonomically shaped clamp is ideal for measurements in hard-to-reach places. The pliers opening covers cables up to 20 mm. The current clamp is suitable for systems up to CAT III 600 V or CAT IV 300 V.

The Chauvin Arnoux MN 89 provides an output DC voltage of 20 V DC for multimeters with insufficient sensitivity in the AC voltage or AC current measuring ranges.

Accessoires (1 products )

Accessoires (1 product )

Chauvin Arnoux P01196523E

CA5005 analog multimeter

Delivery time upon request

CHF 494.00

About the Manufacturer

Chauvin Arnoux

Chauvin Arnoux stands for highest quality and innovative, highly reliable test equipment in the fields of electrical safety testing, measurement of electrical quantities, power measurement, energy and fault analysis.