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Show all categories Spectrum Analysis / EMC Back

YIC Technologies RFSCANNER | 2D & 3D scanner for antenna pattern measurement and diagnosis, 300 MHz - 6 GHz

Manufacturer number: RFSCANNER

RFSCANNER
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RFSCANNER
RFSCANNER
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RFSCANNER
RFSCANNER
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RFSCANNER
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Highlights Documents / Downloads Description

YIC Technologies RFSCANNER | 2D & 3D near and far field scanner for antenna pattern measurement and diagnosis, bandwidth 300 MHz - 6 GHz.

  • Broadband Frequency Coverage: 300MHz - 6GHz
  • Measurement sensitivity: 0 dBm source power for a reasonably efficient antenna
  • Measurement accuracy: Typically +/- 1.5 dB* (700 MHz - 6 GHz)
  • Measurement repeatability: +/- 0.2 dB
  • Far field resolution: 1.8° for theta and 3.6° for phi
  • Max. radiator size: L 16 cm x W 10 cm
  • Resolution Bandwidth: Resolution Bandwidth = IF Bandwidth of 60MHz
  • Modulation Formats:
    GSM / CDMA / WCDMA / Wi-Fi / WiMAX / LTE
    Bluetooth
    RFID
    GPS
    Custom antenna
  • Connections: PC: USB // Power: 6 VDC, 3.0 A
  • Dimensions (L x W x H): 321mm x W 240mm x 70mm
  • Weight: 3.8kg

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Documents & Downloads

Datasheet
pdf | 1.07 MB
User report
pdf | 0.95 MB
Userguide
pdf | 0.90 MB

Description

RFSCANNER | 2D & 3D scanner for antenna pattern measurement and diagnosis, 300 MHz - 6 GHz

YIC Technologies' RFScanner is a compact benchtop antenna characterization scanner that helps you analyze your embedded antenna designs in real time and test multiple design iterations at any stage of the design process in seconds on the benchtop. The YIC RFScanner provides far field patterns, bisections, EIRP and TRP in seconds. Novel near-field results, including amplitude, polarity and phase, provide insight into the root causes of antenna performance problems and help troubleshoot far-field radiation patterns.

Connect the RFScanner to a network analyzer or a spectrum analyzer with tracking generator to measure an antenna's gain, efficiency and S11 over a range of frequencies.

Wireless engineers can use the RFScanner to "rapidly prototyp" and explore new designs, new materials and new shapes. Wireless engineers and designers can easily test multiple design variants and optimize even complex embedded designs in seconds at their laboratory bench, without needing time for measurements in shielded chambers. Optimize positioning and layout impact, monitor changes in final product layout or performance in real-time. Take the acceptance test in the shielded chamber to meet final certification requirements with peace of mind, knowing your design will be successful the first time.

About the Manufacturer

YIC Technologies
YIC Technologies
YIC Technologies, based in the UK, specializes in near-field EMC scanner boards for real-time visualization of signal emissions, which can be used to visualize EMC and EMI-related signals in real time to detect signal emissions.
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