Chroma 11890 | HF AC Tester

Manufacturer number: 11890

Chroma 11890 | HF HiPot test device, 500 VA, test frequency 20 kHz - 200 kHz.

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Description

11890 | HF AC Tester

The Chroma HF HiPot test device 11890 is ideal in production systems for the dielectric strength test of HF-HV electronic components, e.g. B. LCD inverter transformer, ceramic capacitor, cable, PCB, automatic testing of the motor glow discharge and safety testing of medical devices with high-frequency leakage current.

Product features:

  • HF HV lifetime test (CV and CC mode)
  • RF dielectric strength test (CV and CC mode)
  • RF breakdown voltage test (CV mode)
  • Test frequency: 20 kHz - 200 kHz
  • Wide output voltage and current range due to combination with different modules (module is adapted and based on the performance of the test device)
  • Output voltage and current monitoring
  • Programmable control of the output voltage waveform
  • Cycle or time counting mode for lifetime test timer
  • Design for lower power consumption and lower temperature rise
  • Large LCD display (320x240 dot matrix)
  • Integrated digital timer

Accessoires (1 product )

Exclusive
Chroma 11805-A
Programmable HF AC Tester 500k
Delivery time upon request
€34,960.00

Alternate products (4 products )

Exclusive
Chroma 11802
Programmable HF AC Tester 500VA, Frequency 20kHz ~ 200kHz
Delivery time upon request
€24,940.00
Exclusive
Chroma 11803
Programmable HF AC Tester 800VA, Frequency 20kHz ~ 200kHz
Delivery time upon request
€37,550.00
Exclusive
Chroma 11805
Programmable HF AC Tester 167V / 6A, 1000VA, Frequency 20kHz ~ 200kHz
Delivery time upon request
€29,950.00
Exclusive
Chroma 11891
Programmable HF AC Tester, 167V / 3 A, 500 VA, 11802 Series - Load Life Tests
Delivery time upon request
€17,420.00

About the Manufacturer

Chroma
Chroma ATE is the world's largest supplier of power test instruments and systems, including programmable AC sources and DC power supplies, laboratory power supplies, AC and DC electronic loads, digital meters, multimeters, and automated test systems.

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